Looks like i may have a drive that is failing
The default Thecus N2100 error reporting made no mention of this failing drive!!!
Is /dev/sdb the top drive or the bottom drive?
This is the smartctl output:
peanuts:/img/bin# smartctl -a -d ata /dev/sdb
smartctl version 5.33 [armv5l-unknown-linux-gnu] Copyright (C) 2002-4 Bruce Allen
Home page is
smartmontools.sourceforge.net/=== START OF INFORMATION SECTION ===
Device Model: ST3400633AS
Firmware Version: 3.AAD
User Capacity: 400,088,457,216 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Wed Feb 28 18:57:28 2007 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 179) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x0a0f 119 083 006 Pre-fail Always - 234172864
3 Spin_Up_Time 0x0003 097 096 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 098 098 020 Old_age Always - 2513
5 Reallocated_Sector_Ct 0x0033 096 096 036 Pre-fail Always - 174
7 Seek_Error_Rate 0x000f 081 061 030 Pre-fail Always - 158857379
9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 5918
10 Spin_Retry_Count 0x0013 097 097 097 Pre-fail Always
FAILING_NOW 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 49
187 Unknown_Attribute 0x0032 001 001 000 Old_age Always - 854
189 Unknown_Attribute 0x003a 092 092 000 Old_age Always - 8
190 Unknown_Attribute 0x0022 058 037 045 Old_age Always In_the_past 60836937770
194 Temperature_Celsius 0x0022 042 063 000 Old_age Always - 42 (Lifetime Min/Max 0/29)
195 Hardware_ECC_Recovered 0x001a 056 046 000 Old_age Always - 4462907
197 Current_Pending_Sector 0x0012 001 001 000 Old_age Always - 47038
198 Offline_Uncorrectable 0x0010 001 001 000 Old_age Offline - 47038
199 UDMA_CRC_Error_Count 0x003e 200 199 000 Old_age Always - 2
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
Warning: ATA error count 0 inconsistent with error log pointer 3
ATA Error Count: 0
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 0 occurred at disk power-on lifetime: 64760 hours (2698 days + 8 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
9d 43 e0 51 01 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
00 9d e0 25 4b d7 cd 01 03:44:11.264 NOP [Reserved subcommand]
00 85 e0 35
c0 cd 6f 03:43:54.880 NOP [Reserved subcommand]
00 84 e0 35 47 ae cd af 03:43:54.880 NOP [Reserved subcommand]
00 1b e0 35 09 98 cd af 03:43:54.880 NOP [Reserved subcommand]
00 94 e0 35 11 85 cd bf 03:43:54.880 NOP [Reserved subcommand]
Error -1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was in a reserved state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 00 36 00 e0 51 01
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
d8 23 35 00 e0 25 33 00 41d+23:33:41.150 [RESERVED]
c8 24 31 00 e0 25 75 00 38d+22:11:51.070 READ DMA
aa 74 2e 00 e0 25 a2 b0 33d+03:12:23.710 [RESERVED]
9a 1c 2d 00 e0 25 40 58 29d+22:51:25.726 [VENDOR SPECIFIC]
89 1c 29 00 e0 25 23 00 26d+15:06:12.510 [VENDOR SPECIFIC]
Error -2 occurred at disk power-on lifetime: 5675 hours (236 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 04 bf 96 e0 Error: UNC at LBA = 0x0096bf04 = 9879300
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 04 bf 96 e0 00 7d+08:31:26.270 READ DMA EXT
25 00 08 04 bf 96 e0 00 7d+08:31:24.470 READ DMA EXT
25 00 08 fc be 96 e0 00 7d+08:31:24.469 READ DMA EXT
25 00 08 f4 be 96 e0 00 7d+08:31:24.468 READ DMA EXT
25 00 08 ec be 96 e0 00 7d+08:31:24.467 READ DMA EXT
Error -3 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
00 00 00 37 21 01 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
04 b9 80 02 00 40 00 2a 18:39:07.455 [RESERVED]
04 b9 80 02 00 00 08 36 18:47:51.743 [RESERVED]
fc b9 80 02 00 00 08 35 48d+22:33:41.310 [VENDOR SPECIFIC]
f4 b9 80 02 00 00 08 34 47d+09:16:43.582 SECURITY ERASE UNIT
ec b9 80 02 00 00 08 33 45d+19:59:45.854 IDENTIFY DEVICE
Error -4 occurred at disk power-on lifetime: 38590 hours (1607 days + 22 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
51 01 01 00 00 37 21 Error: UNC, IDNF, AMNF at LBA = 0x01370000 = 20381696
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 25 4a 9d 80 02 00 e0 12d+10:15:48.992 READ VERIFY SECTOR(S)
00 25 23 96 80 02 00 e0 00:00:07.384 NOP [Reserved subcommand]
00 25 b1 8e 80 02 00 e0 00:00:05.344 NOP [Reserved subcommand]
00 25 68 87 80 02 00 e0 00:00:03.304 NOP [Reserved subcommand]
00 25 57 87 80 02 00 e0 00:00:01.264 NOP [Reserved subcommand]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.